Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2006-03-14
2006-03-14
Nguyen, Tuan T. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S185090, C365S189050
Reexamination Certificate
active
07012845
ABSTRACT:
For a nonvolatile memory permitting electrical writing and erasing of information to be stored, such as a flash memory, the load on the system developer is to be reduced, and it is to be made possible to avoid, even if such important data for the system as management and address translation information are damaged, an abnormal state in which the system becomes unable to operate. The nonvolatile memory is provided with a replacing function to replace a group of memory cells including defective memory cells which are incapable of normal writing or erasion with a group of memory cells including no defective memory cell, a numbers of rewrites averaging function to grasp the number of data rewrites in each group of memory cells and to so perform replacement of memory cell groups that there may arise no substantial difference in the number of rewrites among a plurality of memory cell groups, and an error correcting function to detect and correct any error in data stored in the memory array, wherein first address translation information deriving from the replacing function and second address translation information deriving from the numbers of rewrites averaging function are stored in respectively prescribed areas in the memory array, and the first address translation information and second address translation information concerning the same memory cell group are stored in a plurality of sets in a time series.
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Iguchi Shinya
Ishii Tatsuya
Kozakai Kenji
Maruyama Jun-ichi
Nakamura Takeshi
Miles & Stockbridge P.C.
Nguyen Tuan T.
Renesas Technology Corp.
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