Nonvolatile memory with backplate

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S390000

Reexamination Certificate

active

07638836

ABSTRACT:
The present invention provides a non-volatile memory string having serially connected dual-gate devices, in which a first gate dielectric layer adjacent a first gate electrode layer in each dual-gate device is charge-storing and in which the second gate electrode adjacent a non-charge storing gate dielectric layer are connected in common. In one implementation, the second gate electrodes of the dual-gate devices in the memory string are provided by a continuous layer of doped polysilicon, tungsten, tantalum nitride, tungsten nitride or any combination of two or more of these conductors.

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