Nonvolatile memory including a verify circuit

Details Nonvolatile memory including a verify circuit Nonvolatile memory including a verify circuit

2007-12-25

2007-12-25

Nguyen, Van Thu (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S096000, C365S189050, C365S189070, C365S225700

Reexamination Certificate

active

11191973

ABSTRACT:
A semiconductor device includes a first nonvolatile memory element group which includes a plurality of first nonvolatile memory elements programmed with data by electrically and irreversibly varying device characteristics, a verify circuit which detects a defective first nonvolatile memory element in the first nonvolatile memory element group, and a second nonvolatile memory element group which includes a plurality of second nonvolatile memory elements programmed with data by electrically and irreversibly varying device characteristics and which stores address data to rescue the defective first nonvolatile memory element.

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patent: 6992945 (2006-01-01), Otsuka
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patent: 2005-63535 (2005-03-01), None
Fairchild Semiconductor. MM74HC138 (3 to 8 line decoder). Feb. 1999. pp. 1-7.
U.S. Appl. No. 10/885,718, filed Jul. 8, 2004, Nobuaki Otsuka.

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