Nonvolatile memory element, nonvolatile semiconductor memory...

Static information storage and retrieval – Systems using particular element – Resistive

Reexamination Certificate

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C365S100000, C365S189011

Reexamination Certificate

active

07965539

ABSTRACT:
A nonvolatile memory element (101) of the present invention includes a resistance variable layer (112) which intervenes between a first electrode (111) and a second electrode (113) and is configured to include at least an oxide of a metal element of VI group, V group or VI group, and when an electric pulse of a specific voltage is applied between the first voltage (111) and the second voltage (113), the resistance variable layer is turned to have a first high-resistance state or a second high-resistance state in which its resistance value is a high-resistance value RH, or a low-resistance state in which its resistance value is a low-resistance value RL.

REFERENCES:
patent: 6473332 (2002-10-01), Ignatiev et al.
patent: 7145791 (2006-12-01), Tsushima et al.
patent: 2006/0002174 (2006-01-01), Hosoi et al.
patent: 2007/0159869 (2007-07-01), Baek et al.
patent: 2007-027537 (2007-02-01), None
patent: 2007-188603 (2007-07-01), None
patent: 2007-235139 (2007-09-01), None
patent: WO 2007/013174 (2007-02-01), None
patent: WO 2008/059701 (2008-05-01), None
patent: WO 2008/126365 (2008-10-01), None
Zhuang, W.W., et al., Novell Colossal Magnetoresistive Thin Film Nonvolatile Resistance Random Access Memory (RRAM), Int. Electron Devices Meet., 2002, pp. 193-196.

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