Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-07-02
2008-12-16
Pham, Hoai v (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S324000, C257SE29300
Reexamination Certificate
active
07465984
ABSTRACT:
A nonvolatile memory element includes a laminated gate provided above a semiconductor substrate with a tunnel insulating film disposed therebetween and having a floating gate electrode, a gate-gate insulating film and a control gate electrode sequentially stacked. The gate-gate insulating film includes a first silicon oxide film, a first aluminum oxide film having hafnium added thereto, a second aluminum oxide film, a third aluminum oxide film having hafnium added thereto and a second silicon oxide film sequentially stacked.
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Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Pham Hoai v
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