Nonvolatile memory element

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S324000, C257SE29300

Reexamination Certificate

active

07465984

ABSTRACT:
A nonvolatile memory element includes a laminated gate provided above a semiconductor substrate with a tunnel insulating film disposed therebetween and having a floating gate electrode, a gate-gate insulating film and a control gate electrode sequentially stacked. The gate-gate insulating film includes a first silicon oxide film, a first aluminum oxide film having hafnium added thereto, a second aluminum oxide film, a third aluminum oxide film having hafnium added thereto and a second silicon oxide film sequentially stacked.

REFERENCES:
patent: 7368780 (2008-05-01), Tanaka et al.
patent: 2005/0266638 (2005-12-01), Cho et al.
patent: 2006/0054957 (2006-03-01), Ozawa et al.
patent: 2006/0081916 (2006-04-01), Sohn et al.
patent: 2006/0094188 (2006-05-01), Kim et al.
patent: 2005-217409 (2005-08-01), None
patent: 10-2005-0113887 (2005-12-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Nonvolatile memory element does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Nonvolatile memory element, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nonvolatile memory element will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4037549

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.