Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-06-07
2011-06-07
Jackson, Jr., Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S003000, C257S004000, C257S005000, C257SE31029, C257SE45002, C365S148000, C365S163000
Reexamination Certificate
active
07956343
ABSTRACT:
Example embodiments provide a nonvolatile memory device using resistive elements. The nonvolatile memory device may include a semiconductor substrate, a plurality of variable resistance patterns on the semiconductor substrate, and a plurality of heat sink patterns that are level with the variable resistance patterns and coupled to a ground voltage.
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Jeong Young-Cheon
Kwon Chul-soon
Kwon Yong-wook
Chen Yu
Harness & Dickey & Pierce P.L.C.
Jackson, Jr. Jerome
Samsung Electronics Co,. Ltd.
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