Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2007-03-20
2007-03-20
Ho, Hoai V. (Department: 2827)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S182000
Reexamination Certificate
active
11180132
ABSTRACT:
A memory circuit includes a latch having a first node and a second node, a plate line, a word selecting line, a first MIS transistor having source/drain nodes thereof coupled to the first node and the plate line, respectively, and a gate node thereof coupled to the word selecting line, a second MIS transistor having source/drain nodes thereof coupled to the second node and the plate line, respectively, and a gate node thereof coupled to the word selecting line, and a driver configured to set the plate line to a first potential causing a current to flow in a first direction through the first MIS transistor in a first operation mode and to a second potential causing a current to flow in a second direction through the first MIS transistor in a second operation mode, the first operation mode causing a lingering change in characteristics of the first MIS transistor.
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Ho Hoai V.
Ladas & Parry LLP
Nscore Inc.
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