Nonvolatile flash memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S316000

Reexamination Certificate

active

11024438

ABSTRACT:
A method of fabricating nonvolatile memory devices is disclosed. A nonvolatile memory device comprises: a polysilicon gate on a semiconductor substrate; a gate oxide layer between the polysilicon gate and the substrate; sidewall floating gates on the bottom of the lateral faces of the polysilicon gate; tunnel oxide layers between the sidewall floating gates and the substrate; block oxide layers between the polysilicon gate and the sidewall floating gates; sidewall spacers on the sidewalls of the polysilicon gate and the sidewall floating gates; source and drain extension regions on the substrate under the sidewall spacers; and source and drain regions adjacent to the source and drain extension regions.

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patent: 2005/0139897 (2005-06-01), Jung
patent: 2005/0162884 (2005-07-01), Jung

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