Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-02-13
2007-02-13
Huynh, Andy (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S316000
Reexamination Certificate
active
11024438
ABSTRACT:
A method of fabricating nonvolatile memory devices is disclosed. A nonvolatile memory device comprises: a polysilicon gate on a semiconductor substrate; a gate oxide layer between the polysilicon gate and the substrate; sidewall floating gates on the bottom of the lateral faces of the polysilicon gate; tunnel oxide layers between the sidewall floating gates and the substrate; block oxide layers between the polysilicon gate and the sidewall floating gates; sidewall spacers on the sidewalls of the polysilicon gate and the sidewall floating gates; source and drain extension regions on the substrate under the sidewall spacers; and source and drain regions adjacent to the source and drain extension regions.
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Dongbu Electronics Co. Ltd.
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Huynh Andy
Taylor Earl
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