Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Patent
1992-12-11
1995-05-09
Gutierrez, Diego F. F.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
By loading of specimen
73150A, 73821, G01N 1904, G01N 308
Patent
active
054129974
ABSTRACT:
The present invention comprises a test system for non-destructively testing the attachment strength of a plurality of electric wires each connected to a corresponding input/output (I/O) port in an integrated circuit (IC) dice. The test system comprises a test bench for placing said integrated circuit dice thereon. The test system further comprises a force asserting means including a testing pin for asserting a controlled amount of pressing force along a predefined direction to each of the electric wires near said corresponding I/O ports on said IC dice. The test system also includes a control means including a testing arm connecting to the testing pin for controlling and positioning the testing pin to apply the controlled amount of force to each of the electric wires. The control means further includes a force measurement means for measuring the amount of force applied to each of the electric wires. The control means further comprising a positioning means which includes a plurality of stepping motors for adjusting the position of the testing arm. A test computer is connected to the control means to control the control means whereby the testing processes are performed in an automated manner.
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Hu Dyi-Chung
Jeng Jen-Huang
Gutierrez Diego F. F.
Industrial Technology Research Institute
Lin Bo-In
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