Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-01-18
2005-01-18
Nelms, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S325000
Reexamination Certificate
active
06844589
ABSTRACT:
A non-volatile SONOS memory device includes a semiconductor substrate having a source region and a drain region. A channel is formed between the source region and the drain region. A gate insulation layer including a nitride layer is formed over the channel, and a gate is formed over the gate insulation layer. The channel is a stepped channel including a top part, an inclined part and a bottom part. The nitride layer is formed over the inclined part and the bottom part, and the top part of the channel is adjacent to the source region and the bottom part of the channel is adjacent to the drain region.
REFERENCES:
patent: 6472706 (2002-10-01), Widdershoven et al.
F. Chau & Associates LLC
Ho Tu-Tu
Nelms David
Samsung Electronics Co. LTD
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