Non-volatile semiconductor storage device and method of...

Semiconductor device manufacturing: process – Making device array and selectively interconnecting – With electrical circuit layout

Reexamination Certificate

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C257S314000, C257S329000, C365S185170

Reexamination Certificate

active

07927926

ABSTRACT:
A non-volatile semiconductor storage device has a plurality of memory strings with a plurality of electrically rewritable memory cells connected in series. Each of the memory strings comprises: a first columnar semiconductor layer extending in a vertical direction to a substrate; a charge accumulation layer formed around the first columnar semiconductor layer via a first insulation layer; and a first conductive layer formed around the charge accumulation layer via a second insulation layer. Each of the first conductive layers is formed to expand in a two-dimensional manner, and air gaps are formed between the first conductive layers located there above and there below.

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Office Action issued Aug. 10, 2010, in Japanese Patent Application No. 2008-065882 (with English-language Translation).
Office Action issued Nov. 9, 2010 in JP Application No. 2008-065882 (With English Translation).
Office Action Distpatch Nov. 10, 2010, in Korea Patent Application No. 10-2009-21543 (with English translation).

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