Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-07-08
2008-07-08
Smith, Zandra (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S303000, C257SE27103, C438S254000
Reexamination Certificate
active
10488377
ABSTRACT:
A non-volatile semiconductor memory comprising at least one EPROM/EEPROM memory cell that includes a floating gate transistor and a coupling capacitor, said floating gate transistor comprising a field effect transistor and a polysilicon layer, the coupling capacitor comprising a first electrode and a second electrode as well as a dielectric interposed between said electrodes, the first electrode of the coupling capacitor being electrically coupled with the polysilicon layer of the floating gate transistor, and the control electrode of the floating gate transistor forming the second electrode of the coupling capacitor. The invention also relates to a display device and an arrangement for controlling a display device, which each comprise a non-volatile semiconductor memory.
REFERENCES:
patent: 5880991 (1999-03-01), Hsu et al.
patent: 5981335 (1999-11-01), Chi
patent: 5998264 (1999-12-01), Wu
patent: 6784473 (2004-08-01), Sakai et al.
patent: 6965142 (2005-11-01), Diorio et al.
Patent abstracts of Japan. vol. 1996, No. 08, Aug. 30, 1996.
NXP B.V.
Patton Paul E
Smith Zandra
Zawilski Peter
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