Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2011-01-25
2011-01-25
Baker, Stephen M (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
C714S773000
Reexamination Certificate
active
07877669
ABSTRACT:
Data move operations in a memory device are described that enable identification of data errors. Error detection circuitry in the memory device can be operated using parity data or ECC data stored in the memory. Results of the error detection can be accessed by a memory controller for data repair operations by the controller.
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“Samsung Targets Embedded Space with OneNAND Flash”,Innovation OneNAND, e-brochure atSamsung.com; http://www.samsung.com/Products/Semiconductor/Support/ebrochure/memory/samsung—innovation—onenand—051102.pdf, (Nov. 2005), 1 pg.
Eggleston David
Radke Bill
Baker Stephen M
Micro)n Technology, Inc.
Schwegman Lundberg & Woessner, P.A.
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