Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-02-20
2007-02-20
Le, Thao P. (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S321000, C257S315000, C257S314000
Reexamination Certificate
active
10904478
ABSTRACT:
A non-volatile memory is provided. A plurality of stacked gate structure is formed on the substrate. The stacked gate structure includes, upward from the substrate surface, a select gate dielectric layer, a select gate and a cap layer. The spacers are disposed on the sidewalls of the stacked gate structures. The control gates are disposed over the substrate filling the space between the stacked gate structures and are mutually connected together. The floating gates are disposed between the stacked gate structures and positioned between the control gate and the substrate. The inter-gate dielectric layers are disposed between the control gates and the floating gates. The tunneling dielectric layers are disposed between the floating gates and the substrate. The source/drain regions are disposed in the substrate outside the two outermost stacked gate structures.
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Hsu Cheng-Yuan
Hung Chih-Wei
Sung Da
Jianq Chyun IP Office
Le Thao P.
Powerchip Semiconductor Corp.
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