Non-volatile memory in power and linear integrated circuits

Details Non-volatile memory in power and linear integrated circuits Non-volatile memory in power and linear integrated circuits

1995-06-07

1998-01-20

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324512, 340598, G01R 3102, G01R 3100, G08B 2100

Patent

active

057105154

ABSTRACT:
A testable temperature warning circuit (120) in an integrated circuit substrate (124) provides a warning if the substrate temperature exceeds a critical temperature. A programming circuit (140) controls a selection, circuit (128) to establish a programmably selectable temperature at either the critical temperature or a second predetermined temperature lower than the critical temperature to enable the warning circuit operation to be tested at a temperature lower than the critical temperature. In one embodiment, the selection circuit 128 comprises a current source that produces a voltage drop across the resistor 121 and base-emitter of the transistor 122 produces a substrate temperature indicating current of magnitude related to the temperature of the substrate. The substrate temperature indicating current at the second temperature is extrapolatingly related to the substrate temperature indicating current at the critical temperature. A method is also presented for testing a temperature warning circuit fabricated in an integrated circuit substrate.

REFERENCES:
patent: 4137467 (1979-01-01), Plog
patent: 4924212 (1990-05-01), Fruhauf et al.
patent: 4970497 (1990-11-01), Broadwater et al.
patent: 5070322 (1991-12-01), Fujihira
patent: 5349336 (1994-09-01), Nishiura et al.
patent: 5355123 (1994-10-01), Nishiura et al.
patent: 5396130 (1995-03-01), Galbraith et al.

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