Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to nonconductive state
Reexamination Certificate
2006-10-05
2010-02-23
Chaudhari, Chandra (Department: 2891)
Semiconductor device manufacturing: process
Making device array and selectively interconnecting
Using structure alterable to nonconductive state
C257SE21592
Reexamination Certificate
active
07666717
ABSTRACT:
A non-volatile device includes a semiconductor substrate having a fuse window region. At least one fuse crosses the fuse window region. Field regions are arranged outside of the fuse window region and arranged under end portions of the at least one fuse. An isolation layer is configured to isolate the field regions. A fuse insulating layer is interposed between the at least one fuse and the field regions.
REFERENCES:
patent: 6338992 (2002-01-01), Ahmed et al.
patent: 6531757 (2003-03-01), Shiratake
patent: 6617637 (2003-09-01), Hsu et al.
patent: 2000-269471 (2000-09-01), None
patent: 2001-0068736 (2001-07-01), None
Korean Office Action for Korean patent application No. 10-2003-0096767; dated Jul. 28, 2005.
Chang Sung-Nam
Kang Dae-Woong
Park Bong-Tae
Sel Jong-Sun
Chaudhari Chandra
Myers Bigel Sibley & Sajovec P.A.
Samsung Electronics Co,. Ltd.
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