Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2007-07-25
2009-11-03
Jackson, Jr., Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257SE45002, C365S148000
Reexamination Certificate
active
07612360
ABSTRACT:
An integrated circuit memory cell includes a substrate having a first semiconductor region of first conductivity type (e.g., N-type) therein, which may define a portion of a word line within the substrate. An electrically insulating layer is provided on the substrate. The electrically insulating layer has an opening therein that extends opposite a recess in the first semiconductor region. A first insulating spacer is provided on a sidewall of the recess in the first semiconductor region. A diode is provided in the opening. The diode has a first terminal electrically coupled to a bottom of the recess in the first semiconductor region. A variable resistivity material region (e.g., phase-changeable material region) is also provided. The variable resistivity material region is electrically coupled to a second terminal of the diode.
REFERENCES:
patent: 6744088 (2004-06-01), Dennison
patent: 6912153 (2005-06-01), Tihanyi
patent: 2004/0036103 (2004-02-01), Chen et al.
patent: 1020060001060 (2006-01-01), None
Jeong Chang-wook
Lee Kwang-woo
Oh Jae-hee
Budd Paul A
Jackson, Jr. Jerome
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
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