Non-volatile memory devices and systems including bad blocks...

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

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C365S200000, C365S185330

Reexamination Certificate

active

07916540

ABSTRACT:
A method of operating a non-volatile memory device included in a memory card can be provided by re-mapping addresses of bad blocks in a first non-volatile MAT in a memory card and re-mapping addresses of bad blocks in a second non-volatile MAT in the memory card, the second non-volatile MAT including blocks that are address mapped with blocks in the first non-volatile MAT. Also a method of scanning a non-volatile memory device for bad blocks can be provided by sequentially scanning blocks in a non-volatile memory device for data indicating that a respective block is a bad block starting at a starting block address that is above a lowermost block address of the non-volatile memory device, wherein the starting block address is based on a yield for the non-volatile memory device.

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