Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2008-03-27
2010-02-23
Nguyen, Tuan T. (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185180, C365S185260
Reexamination Certificate
active
07668016
ABSTRACT:
Non-volatile memory devices and methods of programming a non-volatile memory device in which electrons are moved between charge trap layers through a pad oxide layer are provided. The non-volatile memory devices include a charge trap layer on a semiconductor substrate and storing electrons, a pad oxide layer on the first charge trap layer, and a second trap layer on the pad oxide layer and storing electrons. In a programming mode in which data is written, the stored electrons are moved between a first position of the first charge trap layer and a first position of the second charge trap layer through the pad oxide layer or between a second position of the first charge trap layer and a second position of the second charge trap layer through the pad oxide layer.
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Choi Sang-moo
Park Sang-jin
Seol Kwang-soo
Shin Woong-chul
Sung Jung-hun
Harness & Dickey & Pierce P.L.C.
Nguyen Tuan T.
Samsung Electronics Co,. Ltd.
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