Non-volatile memory device with conductive sidewall spacer...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S296000, C257S301000, C257SE21196, C257SE21636, C257SE21438

Reexamination Certificate

active

07667253

ABSTRACT:
The present invention relates to a non-volatile memory device having conductive sidewall spacers and a method for fabricating the same. The non-volatile memory device includes: a substrate; a gate insulation layer formed on the substrate; a gate structure formed on the gate insulation layer; a pair of sidewall spacers formed on sidewalls of the gate structure; a pair of conductive sidewall spacers for trapping/detrapping charges formed on the pair of sidewall spacers; a pair of lightly doped drain regions formed in the substrate disposed beneath the sidewalls of the gate structure; and a pair of source/drain regions formed in the substrate disposed beneath edge portions of the pair of conductive sidewall spacers.

REFERENCES:
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patent: 6140171 (2000-10-01), Allen et al.
patent: 6207507 (2001-03-01), Wang
patent: 6207519 (2001-03-01), Kim et al.
patent: 6297093 (2001-10-01), Borel et al.
patent: 6399451 (2002-06-01), Lim et al.
patent: 6528404 (2003-03-01), Kim
patent: 2005/0218445 (2005-10-01), Van Duuren et al.
patent: 1998-073410 (1998-11-01), None
patent: 1998-073410 (1998-11-01), None
patent: 10-0206985 (1999-04-01), None
patent: 2002-0019139 (2002-03-01), None
German Office Action issued in German Patent Application No. DE 10 2004 063 690.7-33, dated Oct. 7, 2008.

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