Electrical computers and digital processing systems: memory – Storage accessing and control – Access timing
Reexamination Certificate
2005-02-08
2005-02-08
Portka, Gary J (Department: 2188)
Electrical computers and digital processing systems: memory
Storage accessing and control
Access timing
C711S169000, C711S218000, C365S230090
Reexamination Certificate
active
06854040
ABSTRACT:
A read control circuit and a reading method for an electronic memory device integrated on a semiconductor includes a non-volatile memory matrix with associated row and column decoders connected to respective outputs of an address counter. An address transition detect (ATD) circuit detects an input transition as the memory device is being accessed, and read amplifiers and attendant registers transfer the data read from the memory matrix to the output. The read control circuit includes a detection circuit to which is input a clock signal and a logic signal to enable reading in the burst mode. A burst read mode control logic circuit is connected downstream of the detection circuit. The method includes accessing the memory matrix in a random read mode, detecting a request for access in the burst read mode, and executing the parallel reading of a plurality of memory words during a single period of time clocked by the clock signal.
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Bartoli Simone
Bedarida Lorenzo
Geraci Antonino
Sali Mauro
Allen Dyer Doppelt Milbrath & Gilchrist, P.A.
Jorgenson Lisa K.
Portka Gary J
STMicroelectronics S.r.l.
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