Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-05-03
2011-05-03
Menz, Douglas M (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S005000, C438S381000
Reexamination Certificate
active
07935952
ABSTRACT:
Provided are a non-volatile memory device having a threshold switching resistor, a memory array including the non-volatile memory device, and methods of manufacturing the same. A non-volatile memory device having a threshold switching resistor may include a first resistor having threshold switching characteristics, an intermediate electrode on the first resistor, and a second resistor having at least two resistance characteristics on the intermediate electrode.
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Lee Chang-Bum
Lee Myoung-jae
Park Young-soo
Harness & Dickey & Pierce P.L.C.
Menz Douglas M
Samsung Electronics Co,. Ltd.
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