Non-volatile memory device and method of fabricating the same

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S005000, C257SE45002, C438S054000

Reexamination Certificate

active

07910909

ABSTRACT:
Provided are a non-volatile memory device that may be configured in a stacked structure and may be more easily highly integrated, and a method of fabricating the non-volatile memory device. At least one first electrode and at least one second electrode are provided. The at least one second electrode may cross the at least one first electrode. At least one data storage layer may be at an intersection between the at least one first electrode and the at least one second electrode. Any one of the at least one first electrode and the at least one second electrode may include at least one junction diode connected to the at least one data storage layer.

REFERENCES:
patent: 7767993 (2010-08-01), Toda et al.
patent: 2008/0210926 (2008-09-01), Lowrey
patent: 2009/0321878 (2009-12-01), Koo et al.
patent: 2010/0072452 (2010-03-01), Kim et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Non-volatile memory device and method of fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Non-volatile memory device and method of fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-volatile memory device and method of fabricating the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2681278

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.