Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2010-07-27
2011-11-15
Sofocleous, Alexander (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C257S314000, C257S319000, C365S185180, C365S185290
Reexamination Certificate
active
08059473
ABSTRACT:
A non-volatile memory device includes a floating gate formed on a substrate with a gate insulation layer interposed therebetween, a tunnel insulation layer formed on the floating gate, a select gate electrode inducing charge introduction through the gate insulation layer, and a control gate electrode inducing charge tunneling occurring through the tunnel insulation layer. The select gate electrode is insulated from the control gate electrode. According to the non-volatile memory device, a select gate electrode and a control gate electrode are formed on a floating gate, and thus a voltage is applied to the respective gate electrodes to write and erase data.
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Han Jeong-Uk
Jeon Hee-Seog
Kim Yong-Tae
Yoon Seung-Beom
F. Chau & Associates LLC
Samsung Electronics Co,. Ltd.
Sofocleous Alexander
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