Non-volatile memory device

Static information storage and retrieval – Systems using particular element – Resistive

Reexamination Certificate

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C365S163000, C365S189050

Reexamination Certificate

active

07817457

ABSTRACT:
According to one embodiment, a nonvolatile memory device includes: a memory cell array including memory cells each having a variable resistance element for nonvolatilely storing data identified by an electrically rewritable resistance value; a first data latch storing write and erase data to be written on a given group of memory cells of the memory cell array for a write and erase operation; and a second data latch storing reference data for performing a compensation operation of the given group to compensate write and erase disturbance accompanied by the write or erase operation.

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Y. Hosoi, et al., “High Speed Unipolar Switching Resistance RAM (RRAM) Technology”, Technical Digest, IEEE International Electron Devices Meeting 2006, 4 pages.

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