Non-volatile memory cell sensing circuit, particularly for...

Static information storage and retrieval – Read/write circuit – Including signal comparison

Reexamination Certificate

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Details

C365S189090, C365S185200, C365S185210

Reexamination Certificate

active

06894934

ABSTRACT:
A sensing circuit for a memory cell includes a first bias current generator connected between a first voltage reference and a first inner circuit node, and a second reference current generator connected to the first voltage reference. A comparator having a first input terminal is connected to a comparison circuit node that is connected to the second reference current generator, a second input terminal is connected to a circuit node that is connected to the first inner circuit node, and an output terminal forms an output terminal of the sensing circuit. A cascode-configured bias circuit is connected between the inner circuit node and a matching circuit node. The cascode-configured bias circuit is also connected to a second voltage reference. A current/voltage conversion stage is connected to the matching circuit node, to the comparison circuit node, and to a third voltage reference.

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patent: 10102180 (2002-05-01), None
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