Non-volatile memory array with resistive sense element block...

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

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C365S189160, C365S171000, C365S173000, C365S148000

Reexamination Certificate

active

07885097

ABSTRACT:
In accordance with various embodiments, a column of non-volatile memory cells is connected between opposing first and second control lines. A fixed reference voltage is applied to the second control line. The memory cells are simultaneously programmed to a first resistive state by applying a first voltage to the first control line that is greater than the fixed reference voltage. Less than all of the memory cells are subsequently simultaneously programmed to a different, second resistive state by applying a second voltage to the first control line that is less than the fixed reference voltage, so that at the conclusion of the respective programming steps a first portion of the memory cells along said column are at the first resistive state and a second portion of the memory cells along said column are at the second resistive state.

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PCT/ISA/210 International Search Report and PCT/ISA/237 Written Opinion for PCT/US2010/041134 from the EPO.

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