Non-volatile electrically alterable semiconductor memory...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S267000, C257SE21179

Reexamination Certificate

active

10798138

ABSTRACT:
In a memory cell array, each memory cell includes a control gate disposed laterally adjacent a floating gate. The memory cells in each memory column are disposed inside a single well. The control gate and the floating gate are disposed between two diffusion regions. Each memory cell may be erased and programmed by applying a combination of voltages to the diffusion regions, the control gate, and the well.

REFERENCES:
patent: 4959812 (1990-09-01), Momodomi et al.
patent: 4980861 (1990-12-01), Herdt et al.
patent: 5414693 (1995-05-01), Ma et al.
patent: 5427968 (1995-06-01), Hong
patent: 5949711 (1999-09-01), Kazerounian
patent: 6191975 (2001-02-01), Shimizu et al.
patent: 6462375 (2002-10-01), Wu
patent: 6765260 (2004-07-01), Hung et al.
patent: 6803276 (2004-10-01), Kim et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Non-volatile electrically alterable semiconductor memory... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Non-volatile electrically alterable semiconductor memory..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-volatile electrically alterable semiconductor memory... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3822874

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.