Non-volatile circuit that disables failed devices

Details Non-volatile circuit that disables failed devices Non-volatile circuit that disables failed devices

1997-09-08

1999-01-12

Nguyen, Viet Q.

Static information storage and retrieval

Read/write circuit

Testing

371 225, G11C 700, H01L 2100

Patent

active

058598030

ABSTRACT:
The present invention discloses a circuit for controlling operation of a functional circuit in a device based on a test result during testing. The circuit comprises a first storage element configured to be in one of a first state and a second state according to the test result, and a first sensing element coupled to the first storage element for generating a first signal used to control the operation of the functional circuit.

REFERENCES:
patent: 5388064 (1995-02-01), Khan
patent: 5442642 (1995-08-01), Ingalls et al.
patent: 5617531 (1997-04-01), Crouch et al.
patent: 5638331 (1997-06-01), Cha et al.
patent: 5654204 (1997-08-01), Anderson
patent: 5708624 (1998-11-01), Leung

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