Electricity: measuring and testing – Determining nonelectric properties by measuring electric...
Reexamination Certificate
2005-05-17
2005-05-17
Le, N. (Department: 2858)
Electricity: measuring and testing
Determining nonelectric properties by measuring electric...
C324S464000, C073S030040
Reexamination Certificate
active
06894474
ABSTRACT:
A probe for measuring plasma properties in a processing chamber, comprises a conductive rod having a front portion and a rear portion. The front portion of the conductive rod comprises a probe surface adapted to be coplanar with an interior wall of the chamber. The probe also includes an insulating sheath circumscribing the conductive rod.
REFERENCES:
patent: 3833851 (1974-09-01), Jobes, Jr. et al.
patent: 5339039 (1994-08-01), Carlile et al.
patent: 5705931 (1998-01-01), Klick
patent: 5801386 (1998-09-01), Todorov et al.
patent: 5936413 (1999-08-01), Booth et al.
patent: 6034781 (2000-03-01), Sarfaty et al.
patent: 6184623 (2001-02-01), Sugai et al.
patent: 6300227 (2001-10-01), Liu et al.
patent: 6356097 (2002-03-01), Loewenhardt et al.
Lai Canfeng
Liang Qiwei
Dole Timothy J.
Le N.
Moser Patterson & Sheridan
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