Non-intrusive plasma probe

Electricity: measuring and testing – Determining nonelectric properties by measuring electric...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S464000, C073S030040

Reexamination Certificate

active

06894474

ABSTRACT:
A probe for measuring plasma properties in a processing chamber, comprises a conductive rod having a front portion and a rear portion. The front portion of the conductive rod comprises a probe surface adapted to be coplanar with an interior wall of the chamber. The probe also includes an insulating sheath circumscribing the conductive rod.

REFERENCES:
patent: 3833851 (1974-09-01), Jobes, Jr. et al.
patent: 5339039 (1994-08-01), Carlile et al.
patent: 5705931 (1998-01-01), Klick
patent: 5801386 (1998-09-01), Todorov et al.
patent: 5936413 (1999-08-01), Booth et al.
patent: 6034781 (2000-03-01), Sarfaty et al.
patent: 6184623 (2001-02-01), Sugai et al.
patent: 6300227 (2001-10-01), Liu et al.
patent: 6356097 (2002-03-01), Loewenhardt et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Non-intrusive plasma probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Non-intrusive plasma probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-intrusive plasma probe will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3433845

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.