Non-destructive testing of aircraft for structural integrity usi

Radiant energy – Photocells; circuits and apparatus – Interference pattern analysis

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

73802, 356347, 359 10, G02B 2742

Patent

active

051130793

ABSTRACT:
A method of using the classic principles of moire patterns and holography to provide defect analysis of variable sensitivity on structures of various sizes, including large aircraft. By taking several holograms (usually a series of four) of the structure which has been illuminated with dual (or multiple) beams of coherent illumination (e.g. laser), each hologram will record an image of the test object which includes an interferometric fringe pattern on the surface. The spacing and orientation of the fringe pattern can be varied by the arrangement and nature of the dual illumination beams.

REFERENCES:
patent: 3619064 (1968-09-01), Brooks
patent: 3644047 (1972-02-01), Brown et al.
patent: 3729249 (1973-04-01), Habegger et al.
patent: 3911733 (1975-10-01), Bhuta et al.
patent: 4084427 (1978-04-01), Jacoby et al.
patent: 4506981 (1985-03-01), Hoff, Jr.
patent: 4981360 (1991-01-01), Schwarz
patent: 5041726 (1991-08-01), Chang et al.
AGARD, "Evaluation of the Potential Benefit to the Aeronautical Field from Laser Technology", No. 195, Published Dec. 1974, Chapter 12, pp. 1-23.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Non-destructive testing of aircraft for structural integrity usi does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Non-destructive testing of aircraft for structural integrity usi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-destructive testing of aircraft for structural integrity usi will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2426757

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.