Non-destructive testing apparatus and non-destructive...

Details Non-destructive testing apparatus and non-destructive... Non-destructive testing apparatus and non-destructive...

2006-10-31

2009-02-24

Nguyen, Vincent Q (Department: 2831)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Using radiant energy

C324S248000

Reexamination Certificate

active

07495449

ABSTRACT:
A non-destructive testing method of improved efficiency. Two one-dimensional images are obtained by scanning an optical line over an object to be tested in an X- and Y-directions each for one scan in lieu of conducting a prior art method of two-dimensionally scanning a optical spot on the object to be tested. A two-dimensional image is reconstructed from the obtained two one-dimensional images. Since only two relative scans between the object to be tested and the optical line is necessary, scanning time is remarkably shortened in comparison with that of the prior art.

REFERENCES:
patent: 5045788 (1991-09-01), Hayashi et al.
patent: 6151118 (2000-11-01), Norita et al.
patent: 7019311 (2006-03-01), Horn
patent: 7026830 (2006-04-01), Shinada et al.
patent: 2007/0189436 (2007-08-01), Goto et al.

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