X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate
2007-01-16
2007-01-16
Glick, Edward J (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Absorption
C378S058000
Reexamination Certificate
active
10875503
ABSTRACT:
An apparatus and method for non-destructive inspection of materials housed in containers involves orienting an X-ray beam emitter and detector to direct and detect an X-ray beam at an angle substantially parallel to a sloped surface of the container to be inspected. A first X-ray apparatus is located opposite a second X-ray apparatus, and both the first and second X-ray apparatus are adapted to provide two X-ray beams. This arrangement provides for imaging of the entire area of a sloped portion of the container without any shadow or hidden spots.
REFERENCES:
patent: 6005912 (1999-12-01), Ocleppo
patent: 6428206 (2002-08-01), Watanabe
patent: 2002/0071520 (2002-06-01), Springer et al.
patent: 2006/0056583 (2006-03-01), Heuft et al.
Hartwig Norbert
Nabors James
Nash Brook
Schrock Todd
Smith Earl
Foley & Lardner LLP
Glick Edward J
Smiths Detection Inc.
Song Hoon
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