Non-destructive inspection apparatus and inspection system using

Details Non-destructive inspection apparatus and inspection system using Non-destructive inspection apparatus and inspection system using

1997-04-02

1999-08-03

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Absorption

378149, G01T 100

Patent

active

059334738

ABSTRACT:
A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.

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