4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Absorption

Yukiya Hattori

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Apparatus and method for detecting threats

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate

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Non-destructive inspection apparatus and inspection system using

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Non-destructive inspection apparatus and inspection system using

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Non-destructive inspection apparatus and inspection system...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1050395

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