Non-contacting workpiece gauging system

Optics: measuring and testing – By polarized light examination – With light attenuation

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250203R, G01B 1114

Patent

active

043290604

ABSTRACT:
A system for finding the position of a workpiece surface relative to a reference through non-contact gauging. The system uses a radiant energy beam projected such that an illuminated spot moves along the workpiece surface with movement of that surface relative to the reference along a measurement direction. An array-type image detector, which is out of physical contact with the workpiece, detects the illumination at each of a number of small areas of the workpiece surface and generates signals representative of the detected illumination. These signals are converted into a test signal which is a function of the difference in overall illumination between larger areas of the workpiece surface. A reference signal is produced and stored for two known positions of a workpiece surface. The test signal and the reference signal are combined with each other to produce a measurement signal indicative of the position of the workpiece surface relative to the reference.

REFERENCES:
patent: 2969018 (1961-01-01), Erst et al.
patent: 3016464 (1962-01-01), Bailey
patent: 3180205 (1965-04-01), Heppe et al.
patent: 3571796 (1971-03-01), Brugger
patent: 3657547 (1972-04-01), Mansfield
patent: 3997795 (1976-12-01), Pohl
patent: 4053234 (1977-10-01), McFarlane
Smith et al. "Optical Alignment Apparatus," IBM Tech. Disclosure Bull., vol. 18, #2, 775, pp. 499-500.

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