4. Facsimile and static presentation processing
  5. Facsimile
  6. Recording apparatus

Joseph Wilder

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Analysis methods for energy dispersive X-ray diffraction pattern

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Industrial system for inspecting and identifying workpieces

Communications: electrical – Digital comparator systems
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Lens inspection system

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function
Patent

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Lens inspection system

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function
Patent

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Lens inspection system

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function
Patent

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Profile ID: LFUS-PAI-P-66227

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