Noisy clock test method and apparatus

Details Noisy clock test method and apparatus Noisy clock test method and apparatus

2007-11-06

2007-11-06

Perveen, Rehana (Department: 2116)

Electrical computers and digital processing systems: support

Clock control of data processing system, component, or data...

C713S500000, C713S601000, C326S093000, C326S096000

Reexamination Certificate

active

10720437

ABSTRACT:
A clock filter for use in filtering an external clock signal to create an internal clock signal for use by an electronic device is provided. The clock filter receives the external clock signal and sets the internal clock signal high when the external clock signal is above a first threshold and sets the internal clock signal low when the external clock signal is below a second threshold. The clock filter holds the internal clock signal constant for a period of time after the clock transitions.

REFERENCES:
patent: 6278652 (2001-08-01), Katsuhisa
patent: 2003/0226054 (2003-12-01), Benno et al.
Merriam-Webster's Collegiate Dictionary, Tenth Edition, 1999, p. 1298.

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