Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2011-06-28
2011-06-28
Richards, N Drew (Department: 2895)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S613000, C438S626000, C438S643000, C438S655000, C257SE21011
Reexamination Certificate
active
07968462
ABSTRACT:
Processes for minimizing contact resistance when using nickel silicide (NiSi) and other similar contact materials are described. These processes include optimizing silicide surface cleaning, silicide surface passivation against oxidation and techniques for diffusion barrier/catalyst layer deposition. Additionally, processes for generating a noble metal (for example platinum, iridium, rhenium, ruthenium, and alloys thereof) activation layer that enables the electroless barrier layer deposition on a NiSi-based contact material are described. The processes may be employed when using NiSi-based materials in other end products. The processes may be employed on silicon-based materials.
REFERENCES:
patent: 6284721 (2001-09-01), Lee
patent: 2005/0173701 (2005-08-01), Kawase et al.
Chiang Tony
Ivanov Igor
Kong Bob
Sun Zhi-Wen
Intermolecular, Inc.
Lee Kyoung
Richards N Drew
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