Nitrogen trifluoride thermal cleaning apparatus and process

Drying and gas or vapor contact with solids – Process – Gas or vapor pressure varies during treatment

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34 85, 34 92, 34408, 34409, F26B 504

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active

057971951

ABSTRACT:
The present invention is a method and apparatus for the dynamic cleaning of semiconductor fabrication equipment and particularly quartzware with thermally activated nitrogen trifluoride wherein the cleaning effluent is safely removed and cleaning by-products isolated or diluted to provide for efficient cleaning and rapid restarts of fabrication equipment so cleaned.

REFERENCES:
patent: 3630051 (1971-12-01), Martin
patent: 4488506 (1984-12-01), Heinecke et al.
patent: 4655800 (1987-04-01), Tsukao et al.
patent: 4796562 (1989-01-01), Brors et al.
patent: 4886444 (1989-12-01), Hirase et al.
patent: 5069887 (1991-12-01), Suenaga et al.
patent: 5127365 (1992-07-01), Koyama et al.
patent: 5186120 (1993-02-01), Ohnishi et al.
patent: 5203956 (1993-04-01), Hansen
patent: 5211796 (1993-05-01), Hansen
patent: 5250323 (1993-10-01), Miyazaki
patent: 5405445 (1995-04-01), Kumada et al.
"Utilizing a portable cycle purge nitrogen venturi for removal of process gases in semiconductor processing gas systems." J. P. Fournier and Michael E. Elta; J. Vac. Sci. Technol. A 10(5), Sep./Oct. 1992; pp. 3376, 3377.

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