Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor
Reexamination Certificate
2009-10-29
2010-11-30
Fahmy, Wael M (Department: 2891)
Semiconductor device manufacturing: process
Making device or circuit emissive of nonelectrical signal
Compound semiconductor
C438S046000, C438S172000, C257SE21090, C257SE21093, C257SE21098, C257SE21110
Reexamination Certificate
active
07842532
ABSTRACT:
A nitride semiconductor device includes: a substrate having a principal surface; a first nitride semiconductor layer formed on the principal surface of the substrate and includes one or more convex portions whose side surfaces are vertical to the principal surface; and a second nitride semiconductor layer selectively grown on the side surfaces of the one or more convex portions of the first nitride semiconductor layer.
REFERENCES:
patent: 6072818 (2000-06-01), Hayakawa
patent: 6734503 (2004-05-01), Hata et al.
patent: 6977953 (2005-12-01), Hata et al.
patent: 2828002 (1998-09-01), None
Shuji Nakamura, et al., “Superbright Green InGaN Single-Quantum-Well-Structure Light-Emitting Diodes”, Jpn. J. Appl. Phys. vol. 34 (1995) pp. L1332-L1335.
Shuji Nakamura, et al., “InGaN/GaN/AiGaN-Based Laser Diodes With Modulation-Doped Strained-Layer Superlattices Grown on an Epitaxially Laterally Overgrown GaN Substrate”.
Shimizu Jun
Takizawa Toshiyuki
Ueda Tetsuzo
Fahmy Wael M
McDermott Will & Emery LLP
Panasonic Corporation
Yang Minchul
LandOfFree
Nitride semiconductor device and method for manufacturing... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Nitride semiconductor device and method for manufacturing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nitride semiconductor device and method for manufacturing... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4190119