Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate
2007-06-21
2010-06-08
Monbleau, Davienne (Department: 2893)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
Field effect transistor
C257S192000, C257S194000, C257SE29246
Reexamination Certificate
active
07732837
ABSTRACT:
In a nitride semiconductor device according to one embodiment of the invention, a p-type gallium nitride (GaN) layer electrically connected to a source electrode and extending and projecting to a drain electrode side with respect to a gate electrode is formed on an undoped or n-type aluminum gallium nitride (AlGaN) layer serving as a barrier layer.
REFERENCES:
patent: 6555851 (2003-04-01), Morizuka
patent: 2005/0189559 (2005-09-01), Saito et al.
patent: WO 2004068590 (2004-08-01), None
Hu, et al., “IEE Electronics Letters”, vol. 36, No. 8, pp. 753-754, (Apr. 13, 2000).
Omura Ichiro
Saito Wataru
Kabushiki Kaisha Toshiba
Monbleau Davienne
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Reames Matthew
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