Nitride semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S192000, C257S194000, C257SE29246

Reexamination Certificate

active

07732837

ABSTRACT:
In a nitride semiconductor device according to one embodiment of the invention, a p-type gallium nitride (GaN) layer electrically connected to a source electrode and extending and projecting to a drain electrode side with respect to a gate electrode is formed on an undoped or n-type aluminum gallium nitride (AlGaN) layer serving as a barrier layer.

REFERENCES:
patent: 6555851 (2003-04-01), Morizuka
patent: 2005/0189559 (2005-09-01), Saito et al.
patent: WO 2004068590 (2004-08-01), None
Hu, et al., “IEE Electronics Letters”, vol. 36, No. 8, pp. 753-754, (Apr. 13, 2000).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Nitride semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Nitride semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nitride semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4206481

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.