Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-12-04
2007-12-04
Vu, David (Department: 2818)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S651000
Reexamination Certificate
active
11185157
ABSTRACT:
A nickel-silicon compound forming method is disclosed which comprises forming nickel on at least one of only silicon and a compound containing silicon, and performing stepwise-heating of the nickel together with the at least one of only silicon and the compound containing silicon.
REFERENCES:
patent: 6225197 (2001-05-01), Maekawa
patent: 6506637 (2003-01-01), Maa et al.
patent: 02-187022 (1990-07-01), None
patent: 07-058063 (1995-03-01), None
patent: 07-169711 (1995-07-01), None
patent: 07-263682 (1995-10-01), None
patent: 08-097420 (1996-04-01), None
patent: 2000-101075 (2000-04-01), None
Office Action (Notification of Reasons for Rejection) from related Japanese Application No. 2003-323434, May 31, 2007.
Koyanagi Mitsumasa
Kurino Hiroyuki
Shim Jeoung Chill
Christensen O'Connor Johnson & Kindness PLLC
Semiconductor Technology Academic Research Center
Vu David
LandOfFree
Nickel-silicon compound forming method, semiconductor device... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Nickel-silicon compound forming method, semiconductor device..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nickel-silicon compound forming method, semiconductor device... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3898384