Static information storage and retrieval – Read/write circuit – Accelerating charge or discharge
Reexamination Certificate
2011-01-04
2011-01-04
Nguyen, Dang T (Department: 2824)
Static information storage and retrieval
Read/write circuit
Accelerating charge or discharge
C365S185250, C365S185290, C365S218000
Reexamination Certificate
active
07864607
ABSTRACT:
Charge pump and discharge circuitry for a non-volatile memory device that splits up the discharge operation into two discharge periods. In a first discharge period, the voltage being discharged (e.g., erase voltage) is discharged through a pair of discharge transistors until the discharging voltage reaches a first voltage level. The path through the pair of discharge transistors is controlled by an intermediate control voltage so that none of the transistors of the pair enter the snapback condition. In the second discharge period, the remaining discharging voltage is fully discharged from the first level through a third discharge transistor.
REFERENCES:
patent: 5617356 (1997-04-01), Golla et al.
patent: 5719807 (1998-02-01), Sali et al.
patent: 6031774 (2000-02-01), Chung
patent: 6438032 (2002-08-01), Pekny et al.
patent: 6667910 (2003-12-01), Abedifard et al.
patent: 6944059 (2005-09-01), Macerola
patent: 7012456 (2006-03-01), Hirose et al.
patent: 0 190 027 (1986-08-01), None
patent: 0668593 (1995-08-01), None
patent: 7-326195 (1995-12-01), None
English abstract for JP7326195A, published Dec. 12, 1995.
Gualandri Stephen
Patel Vipul
Dickstein & Shapiro LLP
Micro)n Technology, Inc.
Nguyen Dang T
Sofocleous Alexander
LandOfFree
Negative voltage discharge scheme to improve snapback in a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Negative voltage discharge scheme to improve snapback in a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Negative voltage discharge scheme to improve snapback in a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2621302