Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Patent
1979-12-10
1981-05-12
Brammer, Jack P.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
20415914, 20415922, 430286, 430288, 430302, 430306, 526323, G03C 168
Patent
active
042672589
ABSTRACT:
A negative type resist is provided for deep ultraviolet light lithography. This resist comprises a polymer of a diallyl ester of a dicarboxylic acid having a degree of dispersion of 3 or less, which is given by the ratio of a weight-average molecular weight Mw to a number-average molecular weight Mn. This deep UV resist can produce a fine detail resist pattern having a high resolution, and it has a high sensitivity to irradiating the coated film of the polymer on a substrate with deep UV light followed by development.
REFERENCES:
patent: 3087915 (1963-04-01), Heiberger et al.
patent: 3113123 (1963-12-01), Heiberger et al.
patent: 3475176 (1969-10-01), Rauner
Kitakohji Toshisuke
Kitamura Kenro
Naito Jiro
Yoneda Yasuhiro
Brammer Jack P.
Fujitsu Limited
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