Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2008-10-24
2009-10-06
Chu, John S (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S325000, C430S330000, C430S905000, C430S907000, C430S910000
Reexamination Certificate
active
07598017
ABSTRACT:
A negative resist composition including:a fluorine-containing resin component (F) containing a structural unit (f1) represented by a general formula (f1-0) shown below, and a structural unit (f2) having an alkali-soluble group,an alkali-soluble resin component (A) excluding the fluorine-containing resin component (F),an acid generator component (B) that generates acid upon exposure, anda cross-linking component (C).[wherein, R7represents a fluorinated alkyl group, and a represents either 0 or 1.]
REFERENCES:
patent: 5945517 (1999-08-01), Nitta et al.
patent: 6153733 (2000-11-01), Yukawa et al.
patent: 6420503 (2002-07-01), Jayaraman et al.
patent: 6509134 (2003-01-01), Ito et al.
patent: 2002/0146638 (2002-10-01), Ito et al.
patent: 2006/0008731 (2006-01-01), Van Der Puy et al.
patent: 2006/0235174 (2006-10-01), Rhodes et al.
patent: H09-208554 (1997-08-01), None
patent: H11-035551 (1999-02-01), None
patent: H11-035552 (1999-02-01), None
patent: H11-035573 (1999-02-01), None
patent: H11-322707 (1999-11-01), None
patent: 2006-291177 (2006-10-01), None
patent: 2006-321928 (2006-11-01), None
patent: 2007-086731 (2007-04-01), None
patent: WO 2004/074242 (2004-09-01), None
patent: WO 2004/076495 (2004-09-01), None
D. Gil et al., “First Microprocessors with Immersion Lithograhy,” Optical Microlithography XVIII, Proceedings of SPIE vol. 5754, pp. 119-128 (2005).
Shun-Ichi Kodama et al., “Synthesis of Novel Fluoropolymer for 157nm Photoresists by Cyclo-polymerization.” Advances in Resist Technology and Processing XIX, Proceedings of SPIE vol. 4690 (2002).
Abe Sho
Iwashita Jun
Sasaki Kazuhito
Chu John S
Knobbe Martens Olson & Bear LLP
Tokyo Ohka Kogyo Co. Ltd.
LandOfFree
Negative resist composition and method of forming resist... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Negative resist composition and method of forming resist..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Negative resist composition and method of forming resist... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4102177