Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2007-05-01
2007-05-01
Schilling, Richard L. (Department: 1752)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S325000, C430S905000, C430S907000
Reexamination Certificate
active
10382090
ABSTRACT:
New negative-acting photoresist compositions are provided that are particularly useful for imaging at short wavelengths, particularly sub-200 nm wavelengths such as 193 nm. Resists of the invention provide contrast between exposed and unexposed coating layer regions through crosslinking or other solubility switching mechanism. Preferred resists of the invention include a resin component that contains repeat units that facilitate aqueous base solubility.
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Conley et al., “Negative Photoresist for 157 nm Microlithography ; A Progress Report”, Proceedings of SPIE, vol. 4690, pp. 94-100 (2002) .
Barclay George G.
Pugliano Nicola
Corless Peter F.
Edwards Angell Palmer & & Dodge LLP
Frickey Darryl P.
Shipley Company L.L.C.
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