Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-05-31
2005-05-31
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090
Reexamination Certificate
active
06900653
ABSTRACT:
A needle fixture of a probe card and a needle fixing method in semiconductor inspection equipment include a needle fixture of a probe card in semiconductor inspection equipment including a printed circuit board; a needle fixture installed in the printed circuit board; a resin unit affixing a probe needle to the needle fixture using an adhesive; and a separation preventer for preventing separation of the resin unit from the needle fixture, wherein the separation preventer includes: a plurality of notches formed along a bottom surface of the needle fixture; and the adhesive filling the plurality of notches.
REFERENCES:
patent: 4599559 (1986-07-01), Evans
patent: 4965865 (1990-10-01), Trenary
patent: 5670889 (1997-09-01), Okubo et al.
patent: 5926028 (1999-07-01), Mochizuki
patent: 7-098330 (1995-04-01), None
patent: 9-304436 (1997-11-01), None
Choi Ji-Man
Shin In-Dae
Yu Hyun-Sik
Lee, Sterba & Morse P.C.
Nguyen Vinh P.
Samsung Electronics Co,. Ltd.
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