Needle fixture of a probe card in semiconductor inspection...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S754090

Reexamination Certificate

active

06900653

ABSTRACT:
A needle fixture of a probe card and a needle fixing method in semiconductor inspection equipment include a needle fixture of a probe card in semiconductor inspection equipment including a printed circuit board; a needle fixture installed in the printed circuit board; a resin unit affixing a probe needle to the needle fixture using an adhesive; and a separation preventer for preventing separation of the resin unit from the needle fixture, wherein the separation preventer includes: a plurality of notches formed along a bottom surface of the needle fixture; and the adhesive filling the plurality of notches.

REFERENCES:
patent: 4599559 (1986-07-01), Evans
patent: 4965865 (1990-10-01), Trenary
patent: 5670889 (1997-09-01), Okubo et al.
patent: 5926028 (1999-07-01), Mochizuki
patent: 7-098330 (1995-04-01), None
patent: 9-304436 (1997-11-01), None

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