Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2007-07-10
2007-07-10
Baderman, Scott (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S048000
Reexamination Certificate
active
10690917
ABSTRACT:
Methods, systems, and articles of manufacture consistent with the present invention train a real-time health-monitor for a computer-based system while simultaneously monitoring the health of the system. A plurality of signals that each describe an operating condition of a subject data processing system are monitored in real-time. It is determined whether there is a problem with the subject data processing system by comparing at least one of the monitored signals to a corresponding at least one signal in a known signal dataset. The known signal dataset includes a signal value for at least one signal that describes an operating condition of one of a plurality of subject data processing systems. A new signal dataset having an entry for each monitored signal and a corresponding signal value is prepared simultaneously with monitoring the plurality of signals and determining whether there is a problem.
REFERENCES:
patent: 4847795 (1989-07-01), Baker et al.
patent: 5446874 (1995-08-01), Waclawsky et al.
patent: 5500940 (1996-03-01), Skeie
patent: 6163849 (2000-12-01), Nouri et al.
patent: 6208955 (2001-03-01), Provan et al.
patent: 6223306 (2001-04-01), Silva et al.
patent: 6826714 (2004-11-01), Coffey et al.
patent: 6938243 (2005-08-01), Zeevi et al.
patent: 7007200 (2006-02-01), Salem
patent: 7020569 (2006-03-01), Cao et al.
patent: 2003/0018928 (2003-01-01), James et al.
patent: 2004/0078723 (2004-04-01), Gross et al.
patent: 2004/0199573 (2004-10-01), Schwartz et al.
patent: 2005/0188269 (2005-08-01), El-Shimi et al.
Gross Kenneth C.
Votta, Jr. Lawrence G.
Wookey Michael J.
Assessor Brian
Baderman Scott
Sonnenschein Nath & Rosenthal LLP
Sun Microsystems Inc.
LandOfFree
Nearest neighbor approach for improved training of real-time... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Nearest neighbor approach for improved training of real-time..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nearest neighbor approach for improved training of real-time... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3795311