Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-03-04
2008-03-04
Hirshfeld, Andrew H. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C073S104000, C073S865800, C294S086400
Reexamination Certificate
active
07339383
ABSTRACT:
A fixed electrode and a movable electrode used to drive each arm are disposed at a drive unit. As a voltage is applied between the fixed electrode and the movable the electrode, a coulomb force causes the movable the electrode to move, thereby driving the arms along the closing direction. The dimensions of a sample can be measured based upon the electrostatic capacity achieved between the electrodes when the sample becomes gripped by the arms.
REFERENCES:
patent: 5222778 (1993-06-01), Moench
patent: 5727915 (1998-03-01), Suzuki
patent: 6590212 (2003-07-01), Joseph et al.
patent: 7075772 (2006-07-01), Heiland
patent: 2005/0029827 (2005-02-01), Hashiguchi et al.
patent: 2006/0010968 (2006-01-01), Munekane et al.
patent: 07-052072 (1995-02-01), None
patent: 10-337049 (1998-12-01), None
patent: 11-346482 (1999-12-01), None
patent: 3109220 (2000-09-01), None
Hayashi Hiroki
Iwasaki Koji
Konno Takashi
Munekane Masanao
Oi Masamichi
Aoi Electronics Co., Ltd.
Crowell & Moring LLP
Hirshfeld Andrew H.
Natalini Jeff
SII Nano Technology Inc.
LandOfFree
Nanogripper device having length measuring function and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Nanogripper device having length measuring function and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nanogripper device having length measuring function and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2806765